Semiconductor Test Equipment
B&K Portable Transistor Tester
SPECIFICATIONS: In/Out-of-Circuit Tests:Good/Bad Test: Transistors, FETs, SCRS & Darlingtons. Identifies: Transistors as NPN or PNP, FET as N- or P-channel. Identifies: FET-gate lead, all leads of transistors in LO drive; base lead in HI drive & SCR.Applied Test Currents:Base Drive: 250 mA (Hi) or 1 mA (Lo) at 2% duty cycle. Collector Drive: 125 mA at 2% duty cycle. Test Repetition rate: 5Hz.In-Circuit Shunt Limits for Good/Bad Test:Resistance: Down to 10 ohms with Hi drive; down to 1.5K ohms with Lo drive. Capacitance: Up to 25 uF with Hi drive; up to 0.3 uF with Lo drive. |
General:Power: 6 VDC from four "AA" batteries, not included. Standby current, 4 mA; average testing current, 12 mA. Dimensions (HxWxD): 1.75 x 3.75 x 6.6" (4 x 9.5 x 17cm). Weight: 1 lb. (0.45kg). Accessories Supplied: Includes three test leads with mini-lock clips, carrying case, and instruction manual. Part No. 3T7-520 Reg $265.00 Now only |
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Updated April 24, 2000 |